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IµS for XRD applications

New developments in laboratory based X-ray sources and optics
B. Hasse, J. Schmidt-May, F. Hertlein, P. Radcliffe, C. Michaelsen
SPIE Proceedings Volume 10387, 2017

X-Ray Diffractometry with Low Power Microfocus Sources - New Possibilities in the Lab
J. Wiesmann, J. Graf, C. Hoffmann, A. Hembd, C. Michaelsen, N. Yang, H. Cordes, B. He, U. Preckwinkel, K. Erlacher
Particle & Particle Systems Characterization 26 (3), 2010, 112-116

New microfocus source for x-ray diffractometry in the home-lab
B. Hasse, J. Wiesmann, C. Michaelsen
Proceedings of the SPIE 7448, 2009, 74480Q-Q6

Femtosecond hard X-ray plasma sources with a kilohertz repetition rate
F. Zamponi, Z. Ansari, C. v. Korff Schmising, P. Rothhardt, N. Zhavoronkov, M. Woerner, T. Elsaesser, M. Bargheer, T. Trobitzsch-Ryll and M. Haschke
Applied Physics A: Materials Science & Processing 96 (1), 2009, 51-58

Microfocusing X-ray Equipment for the Lab Diffractometer
J. Wiesmann, J. Graf, C. Hoffmann, C. Michaelsen, A. Oehr, U. Preckwinkel, N. Yang, H. Cordes, K. Erlacher

New Possibilities for X-ray Diffractometry
Jörg Wiesmann, Jürgen Graf, Christian Hoffmann, Carsten Michaelsen

Neue Möglichkeiten im Labor: Röntgendiffraktometrie mit Niedrigleistungs-Mikrofokusquellen
J. Wiesmann, C. Michaelsen, J. Graf, A. Oehr, A. Sabeti, K. Wulf, C. Hoffmann, U. Preckwinkel, N. Yang, B. He, H. Cordes

Comparison of focusing optics for femtosecond X-ray diffraction
M. Bargheer, N. Zhavoronkov, R. Bruch, H. Legall, H. Stiel, M. Woerner und T. Elsaesser
Applied Physics B: Lasers and Optics 80 (6), 2005, 715-719